AHMAD HAFIZ JAFARUL TAREK

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Publications (6)

• Properties of Bilayer Zr- and Sm-Oxide Gate Dielectric on 4H-SiC Substrate Under Varying Nitrogen and Oxygen Concentrations
  Ahmad Hafiz Jafarul Tarek, Tahsin Ahmed Mozaffor Onik, Chin Wei Lai +3 more
  Ceramics 2025 DOI: 10.3390/ceramics8020049
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• Development of ZrO2 and Ho2O3 as Gate Dielectrics on 4H-SiC Substrate with N2O and O2 Gas Concentration Variations
  Journal of Electronic Materials 2025 DOI: 10.1007/s11664-025-11804-y
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• Electrical performance of Sm2O3/ZrO2 gate stacks on 4H-SiC via various O2/N2O gas concentrations
  Journal of Materials Science Materials in Electronics 2025 DOI: 10.1007/s10854-025-15607-z
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• Optimizing thermal oxidation temperature for enhanced structural and electrical properties of Ho2O3 ultrathin-film gate dielectric on Ge semiconductor substrate
  Applied Surface Science 2025 DOI: 10.1016/j.apsusc.2025.163224
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• Bilayer gate dielectric of ZrO2 and Ho2O3 on 4H–SiC substrate: structural and electrical characterization
  Journal of Materials Science Materials in Electronics 2024 DOI: 10.1007/s10854-024-13919-0
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• Physical Vapour Deposition of Zr-Based Nano Films on Various Substrates: A Review
  Current Nanoscience 2022 DOI: 10.2174/1573413717666210809105952
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