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Publications (65)
- Effect of substrate temperature and annealing on the growth of TiO2-x thin films deposited by using DC-magnetron sputtering technique Save
- Depth distribution analysis of alloying and impurity elements in Ni-Ti alloy thin films using secondary ion mass spectrometer Save
- Evolution of local atomic structure accompanying devitrification of amorphous Ni-Zr alloy thin films Save
- Comparison of quantitative elemental depth distribution analyses of Ni and Ti in co-sputtered Ni-Ti alloy thin films using MCs+ and M+ secondary ions Save
- Evolution of local atomic structure accompanying devitrification of amorphous Ni-Zr alloy thin films Save
- Investigation of thermally induced changes on structure, morphology and stoichiometry of sputter deposited titanium oxide thin films Save
- Thermal stability of interfacial mixed layers in c-Ni/a-Zr multilayer during annealing: Structural and magnetic properties Save
- Boron carbide thin films deposited by RF-PECVD and PLD technique: A comparative study based on structure, optical properties, and residual stress Save
- Defect depth profiling of sputter-deposited Cu/Nb bilayers using a positron accelerator Save
- Structural properties and surface oxidation states of sputter-deposited TiO<inf>2−x</inf> thin films Save