Pradeep Kumar Biswal

About

I am Dr. Pradeep Kumar Biswal. I have completed Ph.D and M.Tech. from IIT Guwahati in the year 2017 and 2011, respectively. Now, I am working as Assistant Professor in the department of Computer Science & Engineering, IIIT Bhagalpur, Bihar, since October, 2017.

My research interest includes VLSI Testing, Computer Architecture, Discrete Event Systems Modeling, Quantum Computing, etc.

Employment

• IIIT Bhagalpur Assistant Professor
  2017 - Present

Education

Education history is unavailable.

Projects & Funding

Projects & funding information is unavailable.

Publications (14)

• Blockchain-Enhanced Electronic Health Records: A Kafka-Based Approach for IoMT Integration
  Journal of Network and Systems Management 2026 DOI: 10.1007/s10922-025-10025-2
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• Survey and analysis of blockchain technologies with respect to: properties, algorithms, architecture, models, evolution and framework
  Multimedia Tools and Applications 2024 DOI: 10.1007/s11042-024-19580-3
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• A Flexible Concurrent Testing Scheme for Non-Feedback and Feedback Bridging Faults in Integrated Circuits
  Journal of Electronic Testing 2023 DOI: 10.1007/s10836-023-06066-7
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• A Concurrent Testing Scheme for Muller Circuits Using Reduced Ordered Binary Decision Diagram
  2022 IEEE Region 10 Symposium (TENSYMP) 2022 DOI: 10.1109/tensymp54529.2022.9864357
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• A Binary Decision Diagram Approach to On-line Testing of Asynchronous Circuits
  2019 32nd International Conference on VLSI Design and 2019 18th International Conference on Embedded Systems (VLSID) 2019
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• A Binary Decision Diagram Approach to On-line Testing of Asynchronous Circuits with Dynamic and Static C-elements
  Journal of Electronic Testing 2019
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• Decision Diagrams Based On-line Testing of Digital VLSI Circuits
  2017
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• On-line testing of digital vlsi circuits at register transfer level using high level decision diagrams
  Microelectronics journal 2017
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• A discrete event system approach to on-line testing of digital circuits with measurement limitation
  Engineering science and technology, an international journal 2016
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• A Discrete Event System Approach to Online Testing of Speed Independent Circuits.
  VLSI Design 2015
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