DY
Dong-Jin Yun
Samsung Advanced Institute of Technology, Pohang University of Science and Technology
0000-0001-6256-2592
Employment
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Samsung Advanced Institute of Technology
Education
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Pohang University of Science and Technology Dr.
Projects & Funding
Projects & funding information is unavailable.
Publications (25)
- 3D mapping of compositional gradients of core-shell structures in AgInxGa1-xS2 quantum dots by atom probe tomography Save
- Defining the buried electronic structures in solution-processed organic heterojunctions by ultraviolet photoelectron spectroscopy analysis assisted with argon gas cluster ion beam sputtering Save
- Revealing the Intrinsic Electronic Structure of 2D MoS2 Buried Beneath Thick Dielectric Overlayer via Hard X‐ray Photoelectron Spectroscopy Save
- Current-Based Statistical Approach toward Quantitative Thickness Analysis of Oxide Thin Films in Semiconductor Devices Save
- Versatile High-Performance SWNT Electrodes Enabled by Glycerol-Doped PEDOT:PSS Interfacial Engineering Save
- Precise electronic structure analysis of inorganic thin films by highly optimized argon-gas-cluster ion-beam sputtering Save
- Direct observation of 3D nitrogen distribution in silicon-based dielectrics using atom probe tomography Save
- Mechanism of stable lithium plating and stripping in a metal-interlayer-inserted anode-less solid-state lithium metal battery Save
- Analysis of the Minute Differences between the Internal Structures of Green‐Emitting Quantum Dots Via Synchrotron‐Based X‐Ray Photoelectron Spectroscopy Save
- SrTiO3 and (Ba,Sr)TiO3 Films Epitaxially Grown on SrRuO3 Using Atomic Layer Deposition Save