Dr. Kaushal Nigam

Employment

• National Institute of Technology Raipur Faculty
  2022 - Present

Education

Education history is unavailable.

Projects & Funding

Projects & funding information is unavailable.

Publications (62)

• Investigation of Si1−XGeX source dual material stacked gate oxide pocket doped hetero-junction TFET for low power and RF applications
  International Journal of Electronics 2023 DOI: 10.1080/00207217.2023.2173804
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• Performance investigation and impact of trap charges on novel lateral dual gate oxide-bilateral tunnelling based field effect transistor
  Microelectronics Reliability 2023 DOI: 10.1016/j.microrel.2022.114872
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• Theoretical Investigation of Dual-Material Stacked Gate Oxide-Source Dielectric Pocket TFET Based on Interface Trap Charges and Temperature Variations
  Journal of Circuits, Systems and Computers 2023 DOI: 10.1142/s0218126623502523
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• Impact of gate overlap and underlap on analog/RF and linearity performance of dual-material gate-oxide-stack double-gate TFET
  Applied Physics A 2022 DOI: 10.1007/s00339-022-06083-x
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• Design and Performance Evaluation of a Novel Dual Tunneling based TFET Considering Trap Charges for Reliability Improvement
  Silicon 2022 DOI: 10.1007/s12633-022-02188-3
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• Performance assessment of cavity on source dual material split gate GaAs/InAs/Ge junctionless TFET for label-free detection of biomolecules
  Applied Physics A 2022 DOI: 10.1007/s00339-022-06017-7
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• Sensitivity Assessment of Electrically Doped Cavity on Source Junctionless Tunnel Field-Effect Transistor-Based Biosensor
  Journal of Circuits, Systems and Computers 2022 DOI: 10.1142/s0218126623500184
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• Sensitivity Analysis of Junction Free Electrostatically Doped Tunnel-FET Based Biosensor
  Silicon 2022 DOI: 10.1007/s12633-021-01444-2
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• Temperature sensitivity analysis of dual material stack gate oxide source dielectric pocket TFET
  Journal of Computational Electronics 2022 DOI: 10.1007/s10825-022-01902-z
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• Ambipolarity Suppressed Dual-Material Double-Source T-Shaped Tunnel Field-Effect Transistor
  Silicon 2021 DOI: 10.1007/s12633-020-00601-3
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