Aritra Banerjee

Employment

• University of Illinois Chicago Assistant Professor
  2023 - Present
• Imec Principal Research Scientist
  2017 - 2022
• Texas Instruments Inc Analog Design Engineer
  2013 - 2017

Education

• Georgia Institute of Technology Ph.D.
  2009 - 2013

Projects & Funding

Projects & funding information is unavailable.

Publications (13)

• Sub-THz and THz Signal Generation Using Photonic and Electronic Techniques (Invited Paper)
  2019 IEEE MTT-S International Microwave Conference on Hardware and Systems for 5G and Beyond (IMC-5G) 2019 DOI: 10.1109/imc-5g47857.2019.9160391
  +Save
• Millimeter-Wave Transceivers for Wireless Communication, Radar, and Sensing : (Invited Paper)
  2019 IEEE Custom Integrated Circuits Conference (CICC) 2019 DOI: 10.1109/cicc.2019.8780147
  +Save
• Digitally Assisted Built-In Tuning Using Hamming Distance Proportional Signatures in RF Circuits
  IEEE Transactions on Very Large Scale Integration (VLSI) Systems 2016 DOI: 10.1109/tvlsi.2016.2526646
  +Save
• Efficiency improvement techniques for RF power amplifiers in deep submicron CMOS
  2015 IEEE Custom Integrated Circuits Conference (CICC) 2015 DOI: 10.1109/cicc.2015.7338449
  +Save
• High efficiency multi-mode outphasing RF power amplifier in 45nm CMOS
  ESSCIRC Conference 2015 - 41st European Solid-State Circuits Conference (ESSCIRC) 2015 DOI: 10.1109/esscirc.2015.7313855
  +Save
• Digitally-compatible ring oscillator frequency driven tuning of CN-TFT amplifiers: Performance compensation under statistical and morphological variations
  2015 IEEE 20th International Mixed-Signals Testing Workshop (IMSTW) 2015 DOI: 10.1109/ims3tw.2015.7177860
  +Save
• A 25 dBm Outphasing Power Amplifier With Cross-Bridge Combiners
  IEEE Journal of Solid-State Circuits 2015 DOI: 10.1109/jssc.2015.2403316
  +Save
• A PWM Based Fully Integrated Digital Transmitter/PA for WLAN and LTE Applications
  IEEE Journal of Solid-State Circuits 2015 DOI: 10.1109/jssc.2015.2403365
  +Save
• Signature Driven Hierarchical Post-Manufacture Tuning of RF Systems for Performance and Power
  IEEE Transactions on Very Large Scale Integration (VLSI) Systems 2015 DOI: 10.1109/tvlsi.2014.2309114
  +Save
• Automatic Test Stimulus Generation for Diagnosis of RF Transceivers Using Model Parameter Estimation
  IEEE Transactions on Very Large Scale Integration (VLSI) Systems 2015 DOI: 10.1109/tvlsi.2014.2385863
  +Save