Navjeet Bagga

Employment

• Indian Institute of Technology Bhubaneswar Assistant Professor
  2022 - Present

Education

• Indian Institute of Technology Roorkee Ph.D.
  2015 - 2019

Projects & Funding

Projects & funding information is unavailable.

Publications (62)

• A Novel De-Mirroring-Based Analytical Model for Capacitance Extraction of Nanosheet FET Using Dielectric Permittivity Suppression
  IEEE Transactions on Dielectrics and Electrical Insulation 2026 DOI: 10.1109/TDEI.2025.3619803
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• The Role of Dielectric Wall in Forksheet FET: Exploring Electrical-Thermal Intercoupling
  IEEE Transactions on Dielectrics and Electrical Insulation 2026 DOI: 10.1109/TDEI.2025.3610405
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• On the Reliability of Complementary Field Effect Transistor: Unveiling the Role of Grain Granularities and Random Fluctuations
  IEEE Transactions on Device and Materials Reliability 2026 DOI: 10.1109/TDMR.2026.3665263
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• Demonstrating the Electro-Thermal Dynamics in Complementary FETs: Quantifying the Role of Self-Heating and Grain Effect Intercoupling
  IEEE Transactions on Electron Devices 2026 DOI: 10.1109/TED.2026.3664068
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• Electro-thermal Reliability Assessment of an Asymmetric Spacer Complementary FET: Device to Circuit Co-optimization
  IEEE Transactions on Device and Materials Reliability 2026 DOI: 10.1109/TDMR.2026.3716119
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• Reliability Assisted Electro-Physical Modelling of Radiation-Induced Resistance Fluctuation in Nanosheet FET
  IEEE Transactions on Device and Materials Reliability 2026 DOI: 10.1109/TDMR.2026.3713056
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• Design and performance analysis of thin-film solar cell
  2026 DOI: 10.1201/9781003635123-4
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• Statistical analysis of random dopant fluctuation in Complementary FET
  Solid-State Electronics 2025 DOI: 10.1016/j.sse.2025.109254
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• Revealing the Reliability Performance of a Dielectric-Modulated Negative Capacitance Junctionless FinFET Biosensor
  IEEE Transactions on Dielectrics and Electrical Insulation 2025 DOI: 10.1109/TDEI.2024.3504407
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• Demonstrating Novel Interbridge Complementary FET: Capacitance Extraction using Dielectric Permittivity Suppression and Conformal Mapping
  IEEE Transactions on Dielectrics and Electrical Insulation 2025 DOI: 10.1109/TDEI.2025.3645707
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