SUNIL RATHORE

Employment

• Manipal Academy of Higher Education Assistant Professor
  2024 - Present
• Indian Institute of Technology Roorkee Post-Doctoral Fellow
  2023 - 2024
• Vignan's Foundation for Science, Technology & Research Assistant Professor
  2018 - 2019

Education

• PDPM Indian Institute of Information Technology Design and Manufacturing Jabalpur Research Scholar
  2019 - 2023
• National Institute of Technology Goa M.Tech
  2016 - 2018

Projects & Funding

Projects & funding information is unavailable.

Publications (45)

• The Role of Dielectric Wall in Forksheet FET: Exploring Electrical-Thermal Intercoupling
  IEEE Transactions on Dielectrics and Electrical Insulation 2026 1 citation DOI: 10.1109/TDEI.2025.3610405
  +Save
• On the Reliability of Complementary Field Effect Transistor: Unveiling the Role of Grain Granularities and Random Fluctuations
  IEEE Transactions on Device and Materials Reliability 2026 0 citations DOI: 10.1109/TDMR.2026.3665263
  +Save
• Demonstrating the Electro-Thermal Dynamics in Complementary FETs: Quantifying the Role of Self-Heating and Grain Effect Intercoupling
  IEEE Transactions on Electron Devices 2026 0 citations DOI: 10.1109/TED.2026.3664068
  +Save
• Electro-thermal Reliability Assessment of an Asymmetric Spacer Complementary FET: Device to Circuit Co-optimization
  IEEE Transactions on Device and Materials Reliability 2026 0 citations DOI: 10.1109/TDMR.2026.3716119
  +Save
• Reliability Assisted Electro-Physical Modelling of Radiation-Induced Resistance Fluctuation in Nanosheet FET
  IEEE Transactions on Device and Materials Reliability 2026 0 citations DOI: 10.1109/TDMR.2026.3713056
  +Save
• A Novel De-Mirroring-Based Analytical Model for Capacitance Extraction of Nanosheet FET Using Dielectric Permittivity Suppression
  IEEE Transactions on Dielectrics and Electrical Insulation 2026 DOI: 10.1109/TDEI.2025.3619803
  +Save
• Revealing the Reliability Performance of a Dielectric-Modulated Negative Capacitance Junctionless FinFET Biosensor
  IEEE Transactions on Dielectrics and Electrical Insulation 2025 12 citations DOI: 10.1109/TDEI.2024.3504407
  +Save
• Self-Heating Induced Differential Resistance in Complementary FET: The Role of Dielectric Insulation in Thermal Dynamics
  IEEE Transactions on Dielectrics and Electrical Insulation 2025 0 citations DOI: 10.1109/TDEI.2025.3638731
  +Save
• A proof of concept for reliability aware analysis of junctionless negative capacitance FinFET-based hydrogen sensor
  Smart Materials and Structures 2024 14 citations DOI: 10.1088/1361-665X/ad2028
  +Save
• Unveiling the reliability of negative capacitance FinFET with confrontation of different HfO2-ferroelectric dopants
  Solid-State Electronics 2024 6 citations DOI: 10.1016/j.sse.2024.108896
  +Save