Biswa Ranjan Senapati

Employment

Employment history is unavailable.

Education

Education history is unavailable.

Projects & Funding

Projects & funding information is unavailable.

Publications (86)

• FraudFusion: A Multi-Modal Ensemble Framework for Anomaly-Based Fraud Detection in Retail POS Systems
  IEEE Access 2026 DOI: 10.1109/ACCESS.2026.3655398
  +Save
• UAV-Assisted Path Planning for Cell Tower Performance Evaluation
  2026 DOI: 10.1007/978-3-032-05117-2_1
  +Save
• Explainable Retail Demand Forecasting: A Hybrid LightGBM-SHAP Framework for Inventory Optimization
  IEEE Access 2026 DOI: 10.1109/ACCESS.2026.3675540
  +Save
• Improved retinal image classification utilizing fundus pictures with ResNet50 and CLAHE-Grad-CAM
  Icoicc 2025 3rd International Conference on Intelligent and Cloud Computing 2025 DOI: 10.1109/ICoICC64033.2025.11052051
  +Save
• Machine learning approaches for predictive maintenance in wireless sensor networks
  Pioneering AI and Data Technologies for Next Gen Security Iot and Smart Ecosystems 2025 DOI: 10.4018/979-8-3373-4672-4.ch002
  +Save
• Leveraging LSTM and BiLSTM Models for Forecasting Meteorological Parameters
  Icoicc 2025 3rd International Conference on Intelligent and Cloud Computing 2025 DOI: 10.1109/ICoICC64033.2025.11052149
  +Save
• Multi-Source Cyber Intrusion Detection Using Ensemble Machine Learning
  Journal of Computer Science 2025 DOI: 10.3844/jcssp.2025.111.123
  +Save
• Optimizing Resource Allocation and Load Balancing for Multimedia Applications in Hybrid Clouds
  2025 International Conference on Automation and Computation Autocom 2025 2025 DOI: 10.1109/AUTOCOM64127.2025.10956969
  +Save
• Precision Agriculture Using a Two-Tier ML Model: Integrating aKNCN Soil Classification with ELM-mBOA Yield Prediction
  SN Computer Science 2025 DOI: 10.1007/s42979-025-04261-1
  +Save
• Quantum Computing and Its Potential Disruption to Data Centers and Edge Computing in Battery Cell Manufacturing Sites
  IEEE International Conference on Electro Information Technology 2025 DOI: 10.1109/eIT64391.2025.11103699
  +Save