Paritosh Meihar

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Publications (6)

• High Remnant Polarization (2Pr > 65 μ C/cm2) in Sputtered HfxZr1- xOy Thin Films
  IEEE Electron Device Letters 2025 DOI: 10.1109/LED.2025.3615202
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• Structural and electrical characterization of phase evolution in epitaxial Gd2O3 due to anneal temperature for silicon on insulator application
  Thin Solid Films 2024 DOI: 10.1016/j.tsf.2024.140559
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• FeFET-Based MirrorBit Cell for High-Density NVM Storage
  IEEE Transactions on Electron Devices 2024 DOI: 10.1109/TED.2024.3361843
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• Ferroelectric MirrorBit-Integrated Field-Programmable Memory Array for the TCAM, Storage, and In-Memory Computing Applications
  IEEE Transactions on Electron Devices 2024 DOI: 10.1109/TED.2024.3376312
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• Evolution of Ferroelectricity With Annealing Temperature and Thickness in Sputter Deposited Undoped HfO2 on Silicon
  IEEE Transactions on Electron Devices 2023 DOI: 10.1109/TED.2023.3319278
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• Interlayer-Engineered Local Epitaxial Templating Induced Enhancement in Polarization (2Pr > 70 μC/cm2) in Hf0.5Zr0.5O2 Thin Films
  IEEE Transactions on Electron Devices 2023 DOI: 10.1109/TED.2023.3277804
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