0000-0001-9899-9016 Employment
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Publications (5)
- Adaptive Mesh Refinement Phase Measuring Deflectometry Using Non-in-situ Optimization Calibration via a Spherical Mirror Save
- Phase Measuring Deflectometry Based on Depth Parameterization and Nonlinear PDE Solving Save
- Phase Measuring Deflectometry for Wafer Thin-Film Stress Mapping Save
- Least-squares phase unwrapping based on hermite interpolation of the southwell regional wavefront method Save
- Practical method for improving the accuracy of weakly stressed birefringence detection by circularly polarized instantaneous photoelasticity Save