M.Ramya

Employment

• SSN College of Engineering Research Scholar
  2021 - 2025

Education

Education history is unavailable.

Projects & Funding

Projects & funding information is unavailable.

Publications (10)

• Enhancing Radiation Hardness of Reconfigurable RingFETs using Numerical Device Simulations
  2025 International Conference on Electronics and Renewable Systems (ICEARS) 2025 DOI: 10.1109/icears64219.2025.10941464
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• Heavy-ion Radiation Strikes on LDD Implanted RingFET using 3D Numerical Device Simulations
  Journal of Scientific & Industrial Research 2025 DOI: 10.56042/jsir.v84i1.7272
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• 3D TCAD Simulation Analysis of Single-Event Transients on LDD ringFETs and LDD ringFET-based Inverter Circuits
  2024 International Conference on Communication, Computing, Smart Materials and Devices (ICCCSMD) 2024 DOI: 10.1109/icccsmd63546.2024.11015201
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• Soft Error Analysis on Junctionless RingFET-Based SRAM
  2024 9th International Conference on Communication and Electronics Systems (ICCES) 2024 DOI: 10.1109/icces63552.2024.10860051
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• Impact of Irradiation on NCFinFET at Different Incidence Angles Using Numerical Device Simulations
  2024 International Conference on Innovative Computing, Intelligent Communication and Smart Electrical Systems (ICSES) 2024 DOI: 10.1109/icses63760.2024.10910448
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• Enhanced dual sensing capabilities of TiO2:ZnO metal oxide sensors with machine learning approach
  Journal of Materials Science: Materials in Electronics 2024 DOI: 10.1007/s10854-024-14022-0
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• Soft error analysis on junctionless ringFET structures and junctionless ringFET-based inverter circuits using numerical device modeling
  Microelectronics Reliability 2024 DOI: 10.1016/j.microrel.2024.115521
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• 3D Simulation Study of Radiation-induced Single Event Transients in Reconfigurable ringFETs with Inner Drain Arrangement
  2024 10th International Conference on Electrical Energy Systems (ICEES) 2024 DOI: 10.1109/icees61253.2024.10776898
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• Investigation of Single Event Transients on RingFET using 3D TCAD Simulations
  Silicon 2023 DOI: 10.1007/s12633-022-02055-1
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• Investigation of transient response on reconfigurable ringFET exposed to heavy-ion radiation strikes using 3D numerical device simulations
  Electrical Engineering 2023 DOI: 10.1007/S00202-023-01833-3
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