Sandeep Kumar

Employment

• Indian Institute of Technology Bombay Research Scientists
  2025 - Present
• National Institute of Technology Rourkela Research Scholar
  2019 - 2024

Education

• National Institute of Technology Rourkela PhD
  2019 - 2024

Projects & Funding

Projects & funding information is unavailable.

Publications (10)

• Smart Pixel with TCReRAM: Tunable Capacitance for Analog Conversion Gain in Next-Generation Imaging Systems
  2026 International VLSI Symposium on Technology Systems and Applications VLSI Tsa 2026 Proceedings of Technical Papers 2026 DOI: 10.1109/VLSITSA69131.2026.11528165
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• Design of Robust SRAM Cell With Enhanced Soft-Error Hardening for Radiation-Prone Applications
  IEEE Transactions on Device and Materials Reliability 2025 DOI: 10.1109/TDMR.2025.3609912
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• Low cost and high performance double-node upset resilient latch for low orbit space applications
  International Journal of Circuit Theory and Applications 2024 DOI: 10.1002/cta.3855
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• Design of soft-error resilient SRAM cell with high read and write stability for robust operations
  AEU - International Journal of Electronics and Communications 2023 DOI: 10.1016/j.aeue.2023.154719
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• Design of Single Node Upset Resilient Latch for Low Power, Low Cost and Highly Robust Applications
  Proceedings 7th IEEE International Test Conference in Asia Itc Asia 2023 2023 DOI: 10.1109/ITC-Asia58802.2023.10301176
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• High performance radiation-hardened SRAM cell design for robust applications
  Microelectronics Journal 2023 DOI: 10.1016/j.mejo.2023.105934
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• A triple-node upset self-healing latch for high speed and robust operation in radiation-prone harsh-environment
  Microelectronics Reliability 2022 DOI: 10.1016/j.microrel.2022.114857
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• A Highly Robust and Low-Power Real-Time Double Node Upset Self-Healing Latch for Radiation-Prone Applications
  IEEE Transactions on Very Large Scale Integration VLSI Systems 2021 DOI: 10.1109/TVLSI.2021.3110135
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• A Self-Healing, High Performance and Low-Cost Radiation Hardened Latch Design
  Proceedings IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems Dft 2021 DOI: 10.1109/DFT52944.2021.9568359
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• Comparing the performance analysis of three tank level control system using feedback and feedforward-feedback configuration
  Proceedings of 2014 IEEE International Conference on Advanced Communication Control and Computing Technologies Icaccct 2014 2015 DOI: 10.1109/ICACCCT.2014.7019439
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