Employment
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Pennsylvania State University Professor1956 - 2000
Education
Education history is unavailable.
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Publications (153)
- Spectroscopic ellipsometry: A historical overview Save
- Characterization of Optical Thin Films by Spectroscopic Ellipsometry Save
- In Situ Annealing Studies of Sol‐Gel Ferroelectric Thin Films by Spectroscopic Ellipsometry Save
- Characterization of inhomogeneous transparent thin films on transparent substrates by spectroscopic ellipsometry: Refractive indices n(λ) of some fluoride coating materials Save
- Ion-implantation induced anomalous surface amorphization in silicon Save
- Determination of the optical function n(») of vitreous silica by spectroscopic ellipsometry with an achromatic compensator Save
- Effect of Preparation Conditions on the Morphology and Eiectrochromic Properties of Amorphous Tungsten Oxide Films Save
- Hydrogen diffusion and reaction processes in thin films investigated by real time spectroscopic ellipsometry Save
- Ion-implantation-caused special damage profiles determined by spectroscopic ellipsometry in crystalline and in relaxed (annealed) amorphous silicon Save
- Spectroscopic ellipsometry studies on ion beam sputter deposited Pb(Zr, Ti)O<inf>3</inf> films on sapphire and Pt-coated silicon substrates Save