0000-0002-1941-2772 Employment
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Publications (34)
- Simulation of Interference‐Enhanced Raman Amplification for Advanced Microelectronic Applications Save
- Contribution of Raman Spectroscopy to Strain Metrology in Trench Array Structures Save
- Quantification of substitutional and interstitial carbon in thin SiGeC films using in-line X-ray-photoelectron spectroscopy Save
- Reduced Pressure – Chemical Vapor Deposition of Monocrystalline and Polycrystalline Si(:B) and SiGe(:B) Layers on Blanket Wafers Save
- Substitutional Carbon Incorporation in SiGeC/Si Heterostructures: Influence of Silicon Precursors Save
- Full Wafer Process Control Through Object Detection Using Region-Based Convolutional Neural Networks Save
- Photoluminescence imaging for slip line detection and characterization in silicon substrates Save
- The Impact of Surface Voltage on Photoluminescence Response for the Detection of Copper and Iron Contamination in Silicon Save
- 1.62µm Global Shutter Quantum Dot Image Sensor Optimized for Near and Shortwave Infrared Save
- Investigation of Photoluminescence Voltage PL-V Measurement: Correlation to Capacitance Voltage C-V for Si/Dielectric Interface Characterization Save