Sumreti Gupta

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Publications (9)

• Cryogenic Performance and Modeling of Sub-5nm Fin-Width Bulk FinFETs for Quantum Computing Applications
  IEEE Journal of the Electron Devices Society 2025 DOI: 10.1109/JEDS.2024.3502728
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• AC-TDDB Behavior in 45 nm PDSOI Ultra-Thin Gate Oxide FETs Using SILC Spectroscopy
  IEEE Transactions on Electron Devices 2024 DOI: 10.1109/TED.2024.3456780
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• Investigation and Subcircuit Modeling of Self-Heating in PDSOI NFETs at Cryogenic Temperatures Using Pulsed I – V Technique for Co-Integrated Quantum Technologies
  IEEE Transactions on Electron Devices 2024 DOI: 10.1109/TED.2024.3435812
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• Investigation and Modeling of Multifrequency CV characteristics for 10-nm Bulk FinFETs at Cryogenic Temperatures
  Solid-State Electronics 2024 DOI: 10.1016/j.sse.2023.108820
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• Flicker Noise (1/f) in 45-nm PDSOI N-Channel FETs at Cryogenic Temperatures for Quantum Computing Applications
  IEEE Journal of the Electron Devices Society 2024 DOI: 10.1109/jeds.2024.3365216
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• Effective Channel Mobility Extraction and Modeling of 10-nm Bulk CMOS FinFETs in Cryogenic Temperature Operation for Quantum Computing Applications
  IEEE Transactions on Electron Devices 2023 DOI: 10.1109/TED.2023.3244159
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• Time-Dependent Dielectric Breakdown in 45-nm PD-SOI N-Channel FETs at Cryogenic Temperatures for Quantum Computing Applications
  IEEE Transactions on Device and Materials Reliability 2023 DOI: 10.1109/TDMR.2023.3312735
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• Accurate Modeling of Cryogenic Temperature Effects in 10-nm Bulk CMOS FinFETs Using the BSIM-CMG Model
  IEEE Electron Device Letters 2022 DOI: 10.1109/led.2022.3158495
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• Cryogenic temperature DC-IV measurements and compact modeling of n-channel bulk FinFETs with 3–4 nm wide fins and 20 nm gate length for quantum computing applications
  Solid-State Electronics 2021 DOI: 10.1016/j.sse.2021.108089
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