Gopal Singh

Employment

• VIT Bhopal University Assistant Professor Grade I
  2026 - Present
• National Institute of Technology Tiruchirappalli Research Scholar
  2020 - 2026

Education

• Delhi Technological University M.Tech
  2018 - 2020
• Institute of Engineering and Rural Technology B.Tech
  2013 - 2017
• Pragati Public Senior Secondary School Intermediate
  2011 - 2012
• The Aditya Birla Public School High School
  2009 - 2010

Projects & Funding

Projects & funding information is unavailable.

Publications (14)

• Performance evaluation of a digitizer circuit for four-wire type resistive sensor
  Measurement 2026 DOI: 10.1016/j.measurement.2026.121860
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• Performance Evaluation of a Digitizer Circuit for Four-wire type Resistive Sensor
  2026 DOI: 10.2139/ssrn.6192941
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• A SYSTEM AND A METHOD FOR MEASURING TEMEPERATURE USING A THERMOCOUPLE
  2025
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• A Digitizer Circuit for Four-Wire Type Resistive Sensor
  Lecture Notes in Electrical Engineering 2025 DOI: 10.1007/978-3-031-84331-0_57
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• Analysis of a Digitizer Circuit With T-Network for Low-Resistance Measurement
  IEEE Transactions on Instrumentation and Measurement 2025 DOI: 10.1109/TIM.2025.3560721
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• High Speed Digitizer for a Contactless Potentiometric Displacement Sensor
  Ieee Applied Sensing Conference, Apscon 2024 DOI: 10.1109/APSCON60364.2024.10466140
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• Performance Evaluation of Dual-Slope Digitizer for Self-Heating Compensation in Resistive Sensor
  IEEE Transactions on Instrumentation and Measurement 2024 DOI: 10.1109/TIM.2023.3348896
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• An Efficient Digitizer for Self-Heating Compensation in Resistive Sensor
  2023 International Conference on Recent Advances in Electrical, Electronics & Digital Healthcare Technologies (REEDCON) 2023 DOI: 10.1109/reedcon57544.2023.10150537
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• A dual-slope RDC using T-Network for Low Resistance Measurement
  2023 IEEE Applied Sensing Conference (APSCON) 2023 DOI: 10.1109/apscon56343.2023.10101142
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• A Novel Dual-Slope Resistance to Digital Converter With Lead Resistance Compensation
  IEEE Transactions on Instrumentation and Measurement 2023 DOI: 10.1109/TIM.2023.3238021
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