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Publications (5)
- Impact of Dielectric Resistive Heater, Bottom Contact and Reading Scheme on the Reliability of Nanoscale Low Power Phase Change Memory (PCM) Cell: 3-D-ADI Modeling Save
- Vertical Ge and GeSn heterojunction gate-all-around tunneling field effect transistors Save
- GaAs based long-wavelength microring resonator optical switches utilising bias assisted carrier-injection induced refractive index change Save
- A novel gate-assisted reverse-read scheme to control bit coupling and read disturb for multibit/cell operation in deeply scaled split-gate SONOS flash EEPROM cells Save
- Dual-bit/cell SONOS flash EEPROMs: Impact of channel engineering on programming speed and bit coupling effect Save