Koushik Ghosh

Employment

Employment history is unavailable.

Education

• Guru Ghasidas Vishwavidyalaya Ph.D.
  2016 - Present

Projects & Funding

Projects & funding information is unavailable.

Publications (12)

• Optical properties, microstructure, and multifractal analyses of ZnS thin films obtained by RF magnetron sputtering
  Journal of Materials Science: Materials in Electronics 2020 DOI: 10.1007/s10854-020-03086-3
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• Annealing time induced roughening in ZnO thin films: A fractal and multifractal assessment
  Materials Science in Semiconductor Processing 2020 DOI: 10.1016/j.mssp.2019.104771
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• Multifractal and optical bandgap characterization of Ta2O5 thin films deposited by electron gun method
  Optical and Quantum Electronics 2020 DOI: 10.1007/s11082-019-2173-5
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• Optical properties tuning by sodium and magnesium co-doping in ZnO thin films for optoelectronic applications
  Materials Today: Proceedings 2020 DOI: 10.1016/j.matpr.2020.01.500
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• Power spectral density-based fractal analysis of annealing effect in low cost solution-processed Al-doped ZnO thin films
  Physica Scripta 2019 DOI: 10.1088/1402-4896/ab292c
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• Comparable nuclear and electronic energy loss effect of Au2+ irradiation on structural, surface morphological, optical and phonon properties of Al:ZnO thin films
  Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 2019 DOI: 10.1016/j.nimb.2019.08.014
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• Stereometric and scaling law analysis of surface morphology of stainless steel type AISI 304 coated with Mn: a conventional and fractal evaluation
  Materials Research Express 2019 DOI: 10.1088/2053-1591/ab4aa6
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• Improving the Corrosion Resistance of Ni/SS Thin Films by Nitrogen Ion Implantation
  Acta Physica Polonica A 2019 DOI: 10.12693/aphyspola.136.536
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• Fractal assessment of ZnO thin films using Higuchi’s algorithm
  AIP Conference Proceedings (DAE SOLID STATE PHYSICS SYMPOSIUM 2018) 2019 DOI: 10.1063/1.5113119
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• Assessment of fractal and multifractal features of sol-gel spin coated ZnO thin film surface
  Materials Research Express 2019 DOI: 10.1088/2053-1591/ab25d7
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