Lakshmanan Balasubramanian

Employment

• Texas Instruments (India) Technologist & Senior Member, Technical Staff (SMTS)
  2006 - 2025
• Institution of Engineering and Technology MIET, CEng, IPRA, PRA
  1998 - Present
• IEEE Microwave Theory and Techniques Society Senior Member; Life Member
  1998 - Present
• IEEE ComSoc Senior Member
  1998 - Present
• IEEE Communications Society Senior Member
  1998 - Present
• IEEE MTT-S Senior Member; Life Member
  1998 - Present
• IEEE SA Senior Member; Secretary, 1801 Working Group; Member of WGs: 1800, 1801, 2416, 2427, 1687.2
  1998 - Present
• IEEE Standards Association Senior Member; Secretary, 1801 Working Group; Member of WGs: 1800, 1801, 2416, 2427, 1687.2
  1998 - Present

Education

Education history is unavailable.

Projects & Funding

Projects & funding information is unavailable.

Publications (23)

• Defect Severity Analysis for Analog Circuits Using Zoom Search and Hierarchical Fault Simulation
  2025 IEEE 43RD VLSI TEST SYMPOSIUM, VTS 2025 DOI: 10.1109/VTS65138.2025.11022957
  +Save
• Hierarchical Fault Simulation for Mixed-Signal Circuits Using Template Based Fault Response Modeling
  IEEE EUROPEAN TEST SYMPOSIUM, ETS 2024 2024 DOI: 10.1109/ETS61313.2024.10567425
  +Save
• Increasing the Efficiency of Hierarchical Fault Simulation through Functional Fault Clustering
  2024 IEEE 67TH INTERNATIONAL MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS, MWSCAS 2024 2024 DOI: 10.1109/MWSCAS60917.2024.10658865
  +Save
• Machine Learning based Waveform Predictions using Discrete Wavelet Transform for Automated Verification of Analog and Mixed Signal Integrated Circuits
  PROCEEDINGS OF THE 37TH INTERNATIONAL CONFERENCE ON VLSI DESIGN, VLSID 2024 AND 23RD INTERNATIONAL CONFERENCE ON EMBEDDED SYSTEMS, ES 2024 2024 DOI: 10.1109/VLSID60093.2024.00015
  +Save
• Analog Coverage-driven Selection of Simulation Corners for AMS Integrated Circuits
  2023 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION, DATE 2023 DOI: 10.23919/DATE56975.2023.10136993
  +Save
• Analysis of Machine Learning Techniques for Time Domain Waveform Prediction in Analog and Mixed Signal Integrated Circuit Verification
  2023 24TH INTERNATIONAL SYMPOSIUM ON QUALITY ELECTRONIC DESIGN, ISQED 2023 DOI: 10.1109/ISQED57927.2023.10129327
  +Save
• Unified Analog Mixed-Signal Defect Simulation and Applications
  2023 IEEE INTERNATIONAL TEST CONFERENCE INDIA, ITC INDIA 2023 DOI: 10.1109/ITCINDIA59034.2023.10235531
  +Save
• The CoveRT Approach for Coverage Management in Analog and Mixed-Signal Integrated Circuits
  IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS 2022 DOI: 10.1109/TCAD.2022.3157686
  +Save
• Tracking Coverage Artefacts for Periodic Signals using Sequence-based Abstractions
  2022 35TH INTERNATIONAL CONFERENCE ON VLSI DESIGN (VLSID 2022) HELD CONCURRENTLY WITH 2022 21ST INTERNATIONAL CONFERENCE ON EMBEDDED SYSTEMS (ES 2022) 2022 DOI: 10.1109/VLSID2022.2022.00036
  +Save
• The Notion of Cross Coverage in AMS Design Verification
  2020 25TH ASIA AND SOUTH PACIFIC DESIGN AUTOMATION CONFERENCE, ASP-DAC 2020 2020
  +Save