Anand Bulusu

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Publications (31)

• Aging-Aware Timing Models for Reliability Enhancement of Inverter-Transmission Gate-Based Circuits
  IEEE Design & Test 2026 DOI: 10.1109/MDAT.2026.3677138
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• Improving robustness and variability tolerance in SRAM-based in-memory computing using body bias
  Semiconductor Science and Technology 2026 DOI: 10.1088/1361-6641/ae887f
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• DAAS: Differential Aging-Aware STA for Precise Timing Closure With Reduced Design Margin
  IEEE Transactions on Device and Materials Reliability 2025 DOI: 10.1109/TDMR.2025.3603098
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• A method to generate additional volatile states using single-domain ferroelectric field-effect transistor
  Journal of Applied Physics 2025 DOI: 10.1063/5.0237955
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• A Methodology for Datapath Energy Prediction and Optimization in Near Threshold Voltage Regime
  IEEE Transactions on Very Large Scale Integration (VLSI) Systems 2025 DOI: 10.1109/TVLSI.2024.3504856
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• Performance Projection of Gate-All-Around (GAA)-Based Negative Capacitance Complementary FET (NC-CFET) Relative to Standard CFET
  IEEE Journal of the Electron Devices Society 2025 DOI: 10.1109/JEDS.2024.3503283
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• Robust and Reliable Energy-Efficient Level Shifter
  IEEE Transactions on Circuits and Systems II: Express Briefs 2025 DOI: 10.1109/TCSII.2025.3547667
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• Universal Compact Model of Flicker Noise in Ferroelectric Logic and Memory Transistors
  IEEE Transactions on Electron Devices 2024 DOI: 10.1109/TED.2023.3287825
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• Impact of Doped Hafnium Oxides on Memory Window and Low-Frequency Noise in Ferroelectric FETs
  IEEE Transactions on Electron Devices 2024 DOI: 10.1109/TED.2024.3400126
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• Multi-Bit Compute-In Memory Architecture Using a C-2C Ladder Network
  IEEE Transactions on Circuits and Systems II: Express Briefs 2024 DOI: 10.1109/TCSII.2023.3329261
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