Maxim Gorbunov

Employment

• Imec R&D Engineer
  2023 - Present
• JSC SPELS lead researcher
  2020 - 2023
• National Research Nuclear University MEPhI Part-time docent
  2013 - 2023
• Scientific Research Institute of System Analysis, Russian Academy of Sciences
  2008 - 2020

Education

• Moscow Engineering Physics Institute (National Research Nuclear University) specialist
  2002 - 2008

Projects & Funding

Projects & funding information is unavailable.

Publications (73)

• Experimental Calibration and Validation of Dynamic Voltage-Dependent SET Model in 65 nm CMOS
  IEEE Transactions on Nuclear Science 2026 DOI: 10.1109/TNS.2026.3675777
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• An In-Depth Study on Device Variability in 22 nm FD-SOI NMOSFETs Under X-Ray Exposure
  IEEE Transactions on Nuclear Science 2026 DOI: 10.1109/TNS.2025.3635536
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• An 80 MS/s 70.8 dB-SNDR Radiation-Tolerant Semi-Time-Interleaved Pipelined-SAR ADC for Space Applications
  IEEE Transactions on Circuits and Systems I: Regular Papers 2025 DOI: 10.1109/TCSI.2024.3516475
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• An 80MS/s 70.79dB-SNDR 60.7fJ/Conv-Step Radiation-Tolerant Semi-Time-interleaved Pipelined-SAR ADC
  2024 IEEE Custom Integrated Circuits Conference (CICC) 2024 DOI: 10.1109/cicc60959.2024.10529093
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• Total Ionizing Dose Effects Sensitivity of Unsalicided Polysilicon Resistors
  IEEE Transactions on Nuclear Science 2024 DOI: 10.1109/TNS.2024.3352491
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• THERE IS AN OPINION: "What could be the program for creating domestic CAD systems?"
  Bezopasnost informacionnyh tehnology 2022 DOI: 10.26583/bit.2022.3.01
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• Platform solutions for the design and development of reliable trusted electronic components
  Bezopasnost informacionnyh tehnology 2022 DOI: 10.26583/bit.2022.2.07
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• Standard Verification Flow Compatible Layout-Aware Fault Injection Technique for Single Event Effects Tolerant ASIC Design
  European Conference on Radiation and Its Effects on Components and Systems (RADECS) 2022 DOI: 10.1109/RADECS47380.2019.9745679
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• Эволюция радиационного поведения субмикроэлектронных устройств при снижении проектных норм и особенности развития инфраструктуры испытаний и исследований
  Nanoindustry Russia 2021 DOI: 10.22184/1993-8578.2021.14.5.298.310
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• A MOS Temperature-Insensitive Voltage Divider and Its Application for Voltage Reference Design
  2021 IEEE 32nd International Conference on Microelectronics (MIEL) 2021 DOI: 10.1109/miel52794.2021.9569156
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