0000-0002-4277-590X Employment
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Publications (29)
- Precision surface metrology using a rapid optimization method in diffraction phase microscopy Save
- Deep learning approach for flow visualization in background-oriented schlieren Save
- Simultaneous estimation of multiple order phase derivatives using deep learning method in digital holographic interferometry Save
- Robust interferogram processing using deep learning and signal subspace method for phase derivative estimation Save
- Fringe pattern normalization using conditional Generative Adversarial Networks Save
- Deep learning assisted state space method for phase derivative estimation in digital holographic interferometry Save
- Surface profile measurement using nonlinear optimization approach in diffraction phase microscopy Save
- Non-contact automated defect detection using a deep learning approach in diffraction phase microscopy Save
- Robust method to process nonuniform intensity holograms in digital holographic microscopy for nanoscale surface metrology Save
- Deep learning assisted non-contact defect identification method using diffraction phase microscopy Save