olivier Gourhant

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Publications (51)

• Wafer-Scale integration of high-Ge content SGOI via hot condensation of Ge for Si-based applications
  Applied Surface Science 2026 1 citation DOI: 10.1016/j.apsusc.2026.166396
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• Ultrathin Ge-Rich SiGe-on-insulator photodetectors enabled by LPCVD growth and thermal Ge enrichment
  Surfaces and Interfaces 2026 0 citations DOI: 10.1016/j.surfin.2026.109559
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• Ge-condensed UT-SGOI as a CMOS-compatible template for thick LPCVD SiGe: Reduced trap signatures and improved electrical response
  Vacuum 2026 4 citations DOI: 10.1016/j.vacuum.2026.115213
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• SGOI wafers with high structural and electrical quality fabricated through Ge condensation in SiGe/SOI
  Vacuum 2025 6 citations DOI: 10.1016/j.vacuum.2025.114410
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• Calibration of second harmonic generation technique to probe the field-effect passivation of Si(100) with Al2O3 dielectric layers
  Journal of Applied Physics 2024 2 citations DOI: 10.1063/5.0188837
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• Morphological Relaxation of Strained Epitaxial Films for Stripe-Geometry Devices
  Advanced Materials Technologies 2024 0 citations DOI: 10.1002/admt.202301655
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• Engineering Epitaxy and Condensation: Fabrication of Ge Nanolayers, Mechanism and Applications
  SSRN 2023 1 citation DOI: 10.2139/ssrn.4343371
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• Engineering epitaxy and condensation: Fabrication of Ge nanolayers, mechanism and applications
  Applied Surface Science 2023 11 citations DOI: 10.1016/j.apsusc.2023.157226
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• Relaxation Dynamics of Heteroepitaxial Films on Mesa-Strip Designs
  2023 0 citations DOI: 10.2139/ssrn.4376090
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• Local defect-free elastic strain relaxation of Si1-xGex embedded into SiO2
  Applied Surface Science 2022 7 citations DOI: 10.1016/j.apsusc.2022.153015
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