Biswajit Ray

Employment

• Colorado State University Associate Professor
  2023 - Present
• University of Alabama in Huntsville College of Engineering Assistant Professor
  2017 - 2023
• Western Digital Technologies Inc Senior Device Engineer
  2013 - 2017

Education

• Purdue University PhD
  2008 - 2013

Projects & Funding

Projects & funding information is unavailable.

Publications (23)

• Reliability, Security, and Sustainability Challenges in 3-D NAND Flash SSDs
  IEEE Design & Test 2026 6 citations DOI: 10.1109/mdat.2025.3606412
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• Page-Overwrite Data Sanitization in 3D NAND Flash: Challenges, Feasibility, and the PULSE Solution
  ACM Transactions on Embedded Computing Systems 2025 1 citation DOI: 10.1145/3761798
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• TCFlash: In-Flash Bulk Bitwise Processing via Dynamic Sensing and TLC Encoding in 3D NAND
  2025 IEEE 43rd International Conference on Computer Design (ICCD) 2025 1 citation DOI: 10.1109/iccd65941.2025.00075
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• Ionizing Radiation-Induced Data Imprinting Effects in SRAM Arrays
  IEEE Transactions on Nuclear Science 2025 5 citations DOI: 10.1109/tns.2025.3543233
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• Exploiting Spintronics at Room Temperature for Long-Wave Infrared Nanophotonic Digital Bolometers
  Nano Letters 2025 12 citations DOI: 10.1021/ACS.NANOLETT.4C05925
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• Data Remanence Vulnerabilities in Commercial SRAM at Low Temperature
  2024 IEEE Physical Assurance and Inspection of Electronics (PAINE) 2024 4 citations DOI: 10.1109/paine62042.2024.10792674
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• Fortifying the NAND Flash Supply Chain with Innovative Security Primitives
  Proceedings of the Ieee/acm International Conference on Computer-aided Design, Iccad 2024 0 citations DOI: 10.1145/3676536.3689917
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• Improving Block Management in 3D NAND Flash SSDs with Sub-Block First Write Sequencing
  Proceedings of the Great Lakes Symposium on Vlsi 2024 2 citations DOI: 10.1145/3649476.3658803
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• Life-after-Death: Exploring Thermal Annealing Conditions to Enhance 3D NAND SSD Endurance
  Proceedings of the Acm Workshop on Hot Topics in Storage and File Systems, Hotstorage 2024 4 citations DOI: 10.1145/3655038.3665949
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• Total Ionizing Dose Effects on the Power-Up State of Static Random-Access Memory
  IEEE Transactions on Nuclear Science 2023 16 citations DOI: 10.1109/tns.2023.3236625
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