Rituraj Singh rathore

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Publications (17)

• Effect of Multi-fin with Independent LER on Intrinsic Statistical Variability Sources
  International Journal of Electrical and Electronic Engineering & Telecommunications 2023 DOI: 10.18178/ijeetc.12.5.358-362
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• (Digital Presentation) Influence of Fin Width Modulation on Nanoscale FinFET
  ECS Meeting Abstracts 2022 DOI: 10.1149/MA2022-02361326mtgabs
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• Effect of Metal Gate Work Function Variation on Underlap FinFET
  Proceedings of the International Spring Seminar on Electronics Technology 2022 DOI: 10.1109/ISSE54558.2022.9812789
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• Impact of Oxide Thickness Fluctuation for Resist- and Spacer-Defined FinFETs
  2022 IEEE Latin America Electron Devices Conference, LAEDC 2022 2022 DOI: 10.1109/LAEDC54796.2022.9908194
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• Influence of Fin Width Modulation on Nanoscale FinFET
  ECS Transactions 2022 DOI: 10.1149/10907.0011ecst
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• Regression Analysis of Static Noise Margin and Transconductance for Underlap Lengths of FinFET
  Proceedings of the International Spring Seminar on Electronics Technology 2022 DOI: 10.1109/ISSE54558.2022.9812809
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• Impact of line edge roughness on the performance of 14-nm FinFET: Device-circuit Co-design
  Superlattices and Microstructures 2018 DOI: 10.1016/j.spmi.2017.10.038
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• Device- and circuit-level variability due to random discrete dopant in resist- and spacer-defined nanoscale FinFETs
  Journal of Micro/ Nanolithography, MEMS, and MOEMS 2018 DOI: 10.1117/1.JMM.17.1.013507
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• Impact of High-k Spacer on Device Performance of Nanoscale Underlap Fully Depleted SOI MOSFET
  Journal of Circuits, Systems and Computers 2018 DOI: 10.1142/s0218126618500639
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• Impact of work function fluctuations on threshold voltage variability in a nanoscale FinFETs
  Proceedings - 2016 IEEE International Symposium on Nanoelectronic and Information Systems, iNIS 2016 2017 DOI: 10.1109/iNIS.2016.066
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