Sunil Babu Eadi

Employment

• Chungnam National University Research Professor
  2018 - Present
• Kumoh National Institute of Technology Postdoctoral Researcher
  2015 - 2018

Education

• University of Hyderabad Masters of Science
  2006 - 2008

Projects & Funding

Projects & funding information is unavailable.

Publications (35)

• Cu-SAPO-34/2D MoS2 based highly sensitive NH3 sensor
  Sensors and Actuators B: Chemical 2026 DOI: 10.1016/j.snb.2026.140398
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• Fluorine-implanted indium-gallium-zinc oxide (IGZO) chemiresistor sensor for high-response NO2 detection
  Chemosphere 2021 DOI: 10.1016/j.chemosphere.2021.131287
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• Indium-gallium –Zinc Oxide (IGZO) Thin-film Gas Sensors Prepared Via Post-deposition High-pressure Annealing For NO2 Detection
  Sensors and Actuators B: Chemical 2021 DOI: 10.1016/j.snb.2021.131082
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• Sensing Properties of Indium-Gallium-Zinc-Oxide Thin Films under the Influence of Thickness and Annealing Ambient
  Journal of The Electrochemical Society 2021 DOI: 10.1149/1945-7111/ac0603
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• Growth of ZnSexO1–x Nanorods and Their Photoelectrochemical Properties
  Energy & Fuels 2021 DOI: 10.1021/acs.energyfuels.0c04280
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• Morphological exploration of chemical vapor–deposited P-doped ZnO nanorods for efficient photoelectrochemical water splitting
  Ceramics International 2021 DOI: 10.1016/j.ceramint.2020.10.237
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• Development of ultrasensitive indium oxide layer with high response to NO<inf>2</inf> gas in indium gallium zinc oxide stack structure using atomic layer deposition
  Materials Letters 2021 DOI: 10.1016/j.matlet.2021.129943
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• NiSi[sbnd]Tb alloy interlayer properties at NiSi/Si junctions for improving thermal stability and contact resistance
  Microelectronic Engineering 2021 DOI: 10.1016/j.mee.2020.111482
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• Test Structures for Noise Reduction of Fully Depleted-Silicon on Insulator p-Type Tunneling FET Using Channel Orientation
  IEEE International Conference on Microelectronic Test Structures 2020 DOI: 10.1109/ICMTS48187.2020.9107915
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• Investigation of Random Telegraph Noise Characteristics with Intentional Hot Carrier Aging
  IEEE International Reliability Physics Symposium Proceedings 2020 DOI: 10.1109/IRPS45951.2020.9129212
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