Vivek Kumar

Employment

• National Institute of Technology Uttarakhand Assistant Professor
  2016 - Present

Education

Education history is unavailable.

Projects & Funding

Projects & funding information is unavailable.

Publications (26)

• Gaussian Process Regression–Driven Thermal Modeling of 5 nm Stacked Nanosheet FETs for Advanced CMOS Thermal Management and Reliability
  IEEE Transactions on Components, Packaging and Manufacturing Technology 2026 DOI: 10.1109/TCPMT.2026.3716356
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• 2D Thermal Contour Modeling of 14 nm SOI FinFET Using Machine Learning for Efficient Thermal Profile Prediction
  Proceedings of the IEEE International Conference on VLSI Design 2025 DOI: 10.1109/VLSID64188.2025.00085
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• Analysis and Modeling of Self-heating and Substrate-Induced Transitions in 5-nm Stacked Nanosheet FET
  Lecture Notes in Electrical Engineering 2025 DOI: 10.1007/978-981-97-5269-0_6
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• Machine learning augmented TCAD assessment of corner radii in nanosheet FET
  Solid State Electronics 2025 DOI: 10.1016/j.sse.2025.109114
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• Multiscale Modeling of Self-Heating-Induced and Deformation-Accelerated Dielectric Traps Impacting Critical Path of Dielectric Breakdown in 5-nm Stacked Nanosheet FET
  IEEE Transactions on Electron Devices 2025 DOI: 10.1109/TED.2025.3535680
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• Parameterized Thermal Compact Modeling for Effective Thermal Management of Advanced Common Multigate Transistors in Sub-7 nm Technology Nodes
  Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems Itherm 2025 DOI: 10.1109/ITherm55376.2025.11235660
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• Performance Enhancement of Terahertz Graphene Patch Antenna Sensor Through Vacancy Defect Engineering: A Multiscale Simulation Approach
  2025 IEEE Microwaves Antennas and Propagation Conference Mapcon 2025 2025 DOI: 10.1109/MAPCON65020.2025.11426685
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• Understanding Trap-Induced Barrier Height Fluctuations in Nickel-Silicon Contacts for Advanced Semiconductor Technology
  IEEE Electron Devices Technology and Manufacturing Conference Strengthening the Globalization in Semiconductors Edtm 2024 2024 DOI: 10.1109/EDTM58488.2024.10512149
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• Unveiling Thermal Cross Talk in 5nm Gate-All-Around Stacked Nanosheet FETs: A Machine Learning Perspective
  Proceedings of the IEEE International Conference on VLSI Design 2024 DOI: 10.1109/VLSID60093.2024.00013
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• Small-signal non-quasi-static model of a multi-fin FinFET for analog and linearity analysis: the role of gate resistance
  Journal of Computational Electronics 2024 DOI: 10.1007/s10825-023-02127-4
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