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Publications (3)
- Understanding the Role of Shape Imperfections on the Bit Error Rates of STT-MRAM Under External Magnetic Fields Save
- Impact of Off-Axis External Magnetic Field Perturbation on the Write Error Slopes of Perpendicular STT-RAM Cell: Micromagnetic Study Save
- Quantifying External Magnetic Field Immunity of the Write Process in Perpendicular Spin-Transfer-Torque Random Access Memory Save