Hiroyuki Fujiwara

Employment

• Gifu University Professor
  2008 - Present
• National Institute of Advanced Industrial Science and Technology Team Leader
  2007 - 2008
• National Institute of Advanced Industrial Science and Technology Senior Research Scientist
  2003 - 2007
• National Institute of Advanced Industrial Science and Technology Research Associate
  2001 - 2003
• Electrotechnical Laboratory, MITI Research Associate
  1998 - 2001
• Pennsylvania State University Postdoc
  1996 - 1998

Education

• Tokyo Institute of Technology Doctor
  1993 - 1996
• Tokyo Institute of Technology Master
  1991 - 1993
• Waseda University Bachelor
  1987 - 1991

Projects & Funding

Projects & funding information is unavailable.

Publications (134)

• Adaptive mixture-of-experts denoising for deep learning of optical ellipsometry spectra
  Machine Learning: Science and Technology 2026 DOI: 10.1088/2632-2153/ae9691
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• Highly accurate classification of material types from spectroscopic ellipsometry heatmap measurements using deep learning
  Applied Physics Letters 2025 DOI: 10.1063/5.0303070
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• Rapid Deposition of PbI2 Precursors in Vacuum/Solution Hybrid Process for Efficient and Industrially Feasible Perovskite Solar Cells
  Solar RRL 2025 DOI: 10.1002/solr.202500557
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• Fully automated spectroscopic ellipsometry analyses: Application to MoOx thin films
  Journal of Applied Physics 2021 DOI: 10.1063/5.0052210
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• Very small tail state formation in Cu2ZnGeSe4
  Applied Physics Letters 2018 DOI: 10.1063/1.5031799
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• Amorphous/crystalline si heterojunction solar cells
  Springer Series in Optical Sciences 2018 DOI: 10.1007/978-3-319-75377-5_9
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• Analysis of optical and recombination losses in solar cells
  Springer Series in Optical Sciences 2018 DOI: 10.1007/978-3-319-95138-6_2
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• Characterization of textured structures
  Springer Series in Optical Sciences 2018 DOI: 10.1007/978-3-319-95138-6_4
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• Effect of roughness on ellipsometry analysis
  Springer Series in Optical Sciences 2018 DOI: 10.1007/978-3-319-75377-5_6
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• Inorganic semiconductors and passivation layers
  Springer Series in Optical Sciences 2018 DOI: 10.1007/978-3-319-95138-6_8
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