Dr. Dheeern Ku Mahapatra

Employment

• VIT University Associate Professor Grade I
  2022 - Present
• Madanapalle Institute of Technology and Science Senior Assistant Professor
  2019 - 2022

Education

• National Institute of Technology Rourkela Ph.D.
  ? - 2019
• Veer Surendra Sai University of Technology M.Tech.
  ? - 2013
• Biju Patnaik University of Technology B.Tech.
  ? - 2010

Projects & Funding

Projects & funding information is unavailable.

Publications (19)

• A Coarse-to-Fine Registration Algorithm for the Remote Sensing Optical Image Using Improved KAZE and DE-Optimization
  IEEE Access 2026 DOI: 10.1109/ACCESS.2026.3703420
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• An Efficient CFAR Detector for Burr Type-XII Distributed SAR Ground Clutter
  IEEE Access 2026 DOI: 10.1109/ACCESS.2026.3695446
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• Zero Forcing detection in spatially correlated Rayleigh/Inverse Gamma composite fading channels: A sum rate perspective
  AEU - International Journal of Electronics and Communications 2026 DOI: 10.1016/j.aeue.2025.156060
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• A hybrid Autoencoders-Isolation Forest Network (AEIFNet) based anomaly detection for Miners’ safety
  Engineering Research Express 2025 DOI: 10.1088/2631-8695/ae1eea
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• ML-driven investigation of non-ideal effects in multi-gate MOSFET characteristics for sub-10 nm technologies
  Engineering Research Express 2025 DOI: 10.1088/2631-8695/ae0250
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• A Semi-Angular Cylindrical Shape-Based Wideband Circularly Polarized Dielectric Resonator Antenna for C-V2X and Sub-6 GHz IoT Applications
  IEEE Access 2025 DOI: 10.1109/ACCESS.2025.3580143
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• Change Detection in Remote Sensing Optical Images Using a SPSA-Based Improved Random Forest Algorithm
  IEEE Access 2025 DOI: 10.1109/ACCESS.2025.3638638
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• Closed-Form Solution for CFAR Detection Threshold in G0 Distributed SAR Clutter
  IEEE Access 2025 DOI: 10.1109/ACCESS.2025.3581682
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• Employing a Mixture of Rayleigh and Inverse Gaussian Distributions as SAR Clutter Texture Model in MAP Estimation for Efficient Speckle Suppression
  IEEE Access 2025 DOI: 10.1109/ACCESS.2025.3569417
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• A Review on Parametric and Semiparametric Distributions in Characterizing Synthetic Aperture Radar Clutter Data
  IEEE Access 2024 DOI: 10.1109/ACCESS.2024.3412733
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