Supriyo Srimani

Employment

• Indian Institute of Engineering Science and Technology PhD Schlar
  2016 - Present

Education

Education history is unavailable.

Projects & Funding

Projects & funding information is unavailable.

Publications (12)

• A Statistical Approach of Analog Circuit Fault Detection Utilizing Kolmogorov–Smirnov Test Method
  Circuits, Systems, and Signal Processing 2020 DOI: 10.1007/s00034-020-01572-x
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• Analog Circuit Fault Detection by Impulse Response-Based Signature Analysis
  Circuits, Systems, and Signal Processing 2020 DOI: 10.1007/s00034-020-01375-0
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• Wavelet Transform based fault diagnosis in analog circuits with SVM classifier
  2020 IEEE International Test Conference India, ITC India 2020 2020 DOI: 10.1109/ITCIndia49857.2020.9171798
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• A low power driver amplifier for Fully Differential ADC
  2019 2nd International Symposium on Devices, Circuits and Systems, ISDCS 2019 - Proceedings 2019 DOI: 10.1109/ISDCS.2019.8719267
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• Analytical Model of a Multi-Resolution Sample rate re-configurable Decimator for SDADC
  Proceedings of 2019 IEEE Region 10 Symposium, TENSYMP 2019 2019 DOI: 10.1109/TENSYMP46218.2019.8971138
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• Distortion analysis using volterra kernel for amplifier circuits
  Proceedings - 2019 IEEE International Symposium on Smart Electronic Systems, iSES 2019 2019 DOI: 10.1109/iSES47678.2019.00076
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• Estimation of non-linear effects for capacitive dac in sar adc: An analytical model
  2019 2nd International Symposium on Devices, Circuits and Systems, ISDCS 2019 - Proceedings 2019 DOI: 10.1109/ISDCS.2019.8719248
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• Soft fault detection in analog circuits from probability density function
  2018 International Symposium on Devices, Circuits and Systems (ISDCS) 2018 DOI: 10.1109/isdcs.2018.8379676
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• Parametric fault detection of analog circuits based on Bhattacharyya measure
  Analog Integrated Circuits and Signal Processing 2017 DOI: 10.1007/s10470-017-1052-x
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• Parametric Fault Detection in Analog Circuits: A Statistical Approach
  2016 IEEE 25th Asian Test Symposium (ATS) 2016 DOI: 10.1109/ats.2016.55
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