Asisa Kumar Panigrahy

Employment

• ICFAI Foundation for Higher Education Associate Professor and Head
  2023 - Present
• Gokaraju Rangaraju Institute of Engineering and Technology Associate Professor
  2018 - 2023

Education

• Indian Institute of Technology Hyderabad Ph.D.
  2013 - 2017

Projects & Funding

Projects & funding information is unavailable.

Publications (64)

• A novel high performance FinFET based multioutput hybrid carry skip-carry look ahead (CS-CLA) adder for future processors and cryptographic hardware
  Engineering Research Express 2026 DOI: 10.1088/2631-8695/ae8146
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• A low-power CMOS VCO with 3–13.7 GHz tuning and –89.6 dB/Hz phase noise using current-starved negative skew topology
  Analog Integrated Circuits and Signal Processing 2026 DOI: 10.1007/s10470-026-02620-3
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• WSe2-FETs: Device Architectures, Progress in Doping Strategies, Contact Engineering, Reliability Challenges, and Exciting Prospects for Next-Generation Low-Power Nanoelectronics
  IEEE Transactions on Electron Devices 2026 DOI: 10.1109/TED.2026.3726918
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• Design and Analysis of Gate Stack 7 nm Triple Material Gate Nanosheet FET for Low-Power Application
  2026 DOI: 10.1007/978-981-92-0217-1_4
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• Design and Modeling of a Dual-Nanogap Triple-Heterojunction Split-Gate T-Shaped Channel Vertical DMDG-TFET With Source Pockets for Biosensing
  IEEE Access 2026 DOI: 10.1109/ACCESS.2026.3669996
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• Chef-Based Optimization Algorithm (CBOA)-Based Global Peak Power Tracking Scheme for PV System
  IEEE Access 2025 DOI: 10.1109/ACCESS.2025.3606338
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• Toward Explainable AI in Satellite Imagery: A ResNet-50-Based Study on EuroSAT Classification
  IEEE Access 2025 DOI: 10.1109/ACCESS.2025.3612014
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• Reliability Issues and Degradation Mechanisms of p-GaN Gated E-Mode AlGaN/GaN Power HEMTs: A Critical Review
  IEEE Access 2025 DOI: 10.1109/ACCESS.2025.3569288
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• Gate Stack Analysis of Junctionless Multi-Bridge-Channel FETs for Sub-3 nm Chips
  IEEE Open Journal of Nanotechnology 2025 DOI: 10.1109/OJNANO.2025.3611532
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• A Soft Error Self-Resilience Radiation-Hardened 14T SRAM for Aerospace Applications
  IEEE Access 2025 DOI: 10.1109/ACCESS.2025.3598000
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