KAVITA VISHWAKARMA

Employment

• IMEC Researcher
  2024 - Present

Education

Education history is unavailable.

Projects & Funding

Projects & funding information is unavailable.

Publications (15)

• Observation of fully recoverable leakage behaviour in HfO2 gate oxide of WS2 2D FETs induced by local mechanical stress
  2D Materials 2025 DOI: 10.1088/2053-1583/ae03d4
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• Impact of Mechanical Stress on IGZO TFTs: Enhancing PBTI Degradation
  2025 IEEE International Reliability Physics Symposium (IRPS) 2025 DOI: 10.1109/irps48204.2025.10983050
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• Spectral Response of Solar Blind M-S-M Photodetector With InGaZnO Film Sputter Deposited in Diluted Oxygen Ambience
  IEEE Journal of Quantum Electronics 2023 DOI: 10.1109/JQE.2023.3278263
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• Distribution of Process Induced Traps in Ozone Annealed Indium-Gallium-Zinc-Oxide Film Determined From Noise Characterization
  IEEE Electron Device Letters 2023 DOI: 10.1109/led.2023.3261894
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• Reliability of InGaZnO Transparent ReRAM with Optically Active Pt-Nanodisks
  2023 IEEE International Reliability Physics Symposium (IRPS) 2023 DOI: 10.1109/irps48203.2023.10118092
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• Pulsed Low-Frequency Noise Characterization on Al/ZnO/Al ReRAM to Investigate the Role of Deep-Level Oxygen Vacancy State in HRS Leakage
  IEEE Transactions on Electron Devices 2023 DOI: 10.1109/TED.2023.3319279
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• Formation of Remote Quantum Point Contact Inside Dielectric Medium of an AlO x /SiO x ReRAM
  IEEE Transactions on Electron Devices 2022 DOI: 10.1109/ted.2022.3218000
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• Effect of Non-identical Annealing on the Breakdown Characteristics of Sputtered IGZO Films
  2022 IEEE International Reliability Physics Symposium (IRPS) 2022 DOI: 10.1109/irps48227.2022.9764429
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• Quantum-coupled borophene-based heterolayers for excitonic and molecular sensing applications
  Physical Chemistry Chemical Physics 2022 DOI: 10.1039/d2cp01712a
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• Eight-Level/Cell Storage by Tuning the Spatial Distribution of Dielectrics in a Tri-Layer ReRAM Cell: Electrical Characteristics and Reliability
  IEEE Transactions on Device and Materials Reliability 2021 DOI: 10.1109/tdmr.2021.3120966
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