Ravi Goel

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Publications (9)

• Compact Modeling of Impact Ionization and Conductivity Modulation in LDMOS Transistors
  IEEE Transactions on Electron Devices 2024 DOI: 10.1109/TED.2024.3398620
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• Robust Compact Model of High-Voltage MOSFET’s Drift Region
  IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 2023 DOI: 10.1109/TCAD.2022.3172599
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• Analysis and Modeling of Current Mismatch in Negative Capacitance Field-Effect Transistor
  IEEE Transactions on Electron Devices 2022 DOI: 10.1109/TED.2022.3192216
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• Improved modeling of flicker noise including velocity saturation effect in FinFETs and experimental validation
  Microelectronics Journal 2021 DOI: 10.1016/j.mejo.2021.105020
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• Modeling of Current Mismatch and 1/f Noise for Halo-Implanted Drain-Extended MOSFETs
  IEEE Transactions on Electron Devices 2020 DOI: 10.1109/TED.2020.3027268
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• BSIM-HV: High-Voltage MOSFET Model Including Quasi-Saturation and Self-Heating Effect
  IEEE Transactions on Electron Devices 2019 DOI: 10.1109/TED.2019.2933611
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• Improved Modeling of Bulk Charge Effect for BSIM-BULK Model
  IEEE Transactions on Electron Devices 2019 DOI: 10.1109/TED.2019.2910107
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• Accurate and Computationally Efficient Modeling of Nonquasi Static Effects in MOSFETs for Millimeter-Wave Applications
  IEEE Transactions on Electron Devices 2019 DOI: 10.1109/TED.2018.2854671
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• Analysis and Modeling of Current Mismatch in Laterally Nonuniform MOSFETs
  IEEE Transactions on Electron Devices 2018 DOI: 10.1109/TED.2018.2863649
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