Vivek Sangwan
Center for Reliability Sciences and Technologies, Nanyang Technological University, Chang Gung University, Amity University, Dr. A.P.J. Abdul Kalam Technical University
About
Vivek Sangwan received the B.Tech. degree in electronics and communication engineering from Dr. A.P.J. Abdul Kalam Technical University (formerly known as Gautam Buddha Technical University), Lucknow, India, in 2012, and the M.Tech. degree in electronics and communication engineering from Amity University, Noida, India, in 2014. He received a Ph.D. degree in electronic engineering at the Department of Electronic Engineering, Chang Gung University, Taiwan in 2019.
He is currently a Post Doctoral Researcher in Center for Reliability Sciences and Technologies, Chang Gung University, Taiwan.
His research interests include GaN-HEMT reliability, failure analysis, electromagnetic compatibility, electromagnetic interference, antenna and electromigration.
Employment
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Center for Reliability Sciences and Technologies2020 - Present
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Nanyang Technological University Research Assistant2013 - 2014
Education
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Chang Gung University Ph. D.2015 - 2019
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Amity University Masters in Technology2012 - 2014
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Dr. A.P.J. Abdul Kalam Technical University Bachelor in Technology2008 - 2012
Projects & Funding
Projects & funding information is unavailable.
Publications (14)
- Dual-Band Full-Duplex Compact Antenna for Vehicular Application Save
- Root Cause Analysis of a Printed Circuit Board (PCB) Failure in a Public Transport Communication System Save
- Effect of 150 MeV protons on carbon nanotubes for fabrication of a radiation detector Save
- GaN-Based Readout Circuit System for Reliable Prompt Gamma Imaging in Proton Therapy Save
- Optimization of a T-Shaped MIMO Antenna for Reduction of EMI Save
- Evaluation of the Potential Electromagnetic Interference in Vertically Stacked 3D Integrated Circuits Save
- Moisture resistance evaluation on single electronic package moulding compound Save
- Additional IC Layout Rule from the Perspective of Electromagnetic Emissions for High Frequency Integrated Circuits Save
- ELECTROMAGNETIC HOTSPOTS IDENTIFICATION IN INTEGRATED CIRCUITS Save
- Electromagnetic Induced Failure in GaN-HEMT High Frequency Power Amplifier Save