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Intel Corporation
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Publications (12)
- Digital Probing of Activation Energy for Evaluating Reliability in 2-D and 3-D NAND Flash Memory Save
- Reliability Correlation Coefficient of Fail Bit Counts of Flash Memory Save
- Stable electroluminescence in ambipolar dopant-free lateral p–n junctions Save
- Effects of biased and unbiased illuminations on two-dimensional electron gases in dopant-free GaAs/AlGaAs Save
- Non-adiabatic single-electron pumps in a dopant-free GaAs/AlGaAs 2DEG Save
- In-Plane Anisotropic Photoconduction in Nonpolar Epitaxial a-Plane GaN Save
- InN Quantum Dot Based Infra-Red Photodetectors Save
- Enhanced UV detection by non-polar epitaxial GaN films Save
- Temperature dependent electrical characterisation of Pt/HfO2/n-GaN metal-insulator-semiconductor (MIS) Schottky diodes Save
- Pt/n-GaN metal-semiconductor and Pt/HfO2/n-GaN metal-insulator-semiconductor Schottky diodes Save