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Publications (5)
- An intermediate model for fitting triplet–triplet annihilation in phosphorescent organic light emitting diode materials Save
- Unraveling the effects of OLED active layer morphology on degradation using atom probe tomography Save
- Effect of Diels-Alder Reaction in C<inf>60</inf>-Tetracene Photovoltaic Devices Save
- Characterisation of thin film silicon films deposited by plasma enhanced chemical vapour deposition at 162 MHz, using a large area, scalable, multi-tile-electrode plasma source Save
- Characterisation of PECVD silicon films deposited at 162MHz, using a large area, scalable, multi-tile-electrode plasma source Save