RAJEEWA KUMAR JAISAWAL

Employment

• PDPM Indian Institute of Information Technology Design and Manufacturing Jabalpur Research Scholar
  2019 - Present
• Pranveer Singh Institute of Technology Assistant Professor
  2017 - 2019
• Kashi Institute of Technology Assistant Professor
  2015 - 2017
• Madan Mohan Malaviya University of Technology Teaching Assistantship
  2013 - 2015

Education

• PDPM Indian Institute of Information Technology Design and Manufacturing Jabalpur Ph.D.
  2019 - Present
• Madan Mohan Malaviya University of Technology M.Tech.
  2013 - 2015
• Galgotias College of Engineering and Technology B.Tech.
  2009 - 2013

Projects & Funding

Projects & funding information is unavailable.

Publications (28)

• The Role of Dielectric Wall in Forksheet FET: Exploring Electrical-Thermal Intercoupling
  IEEE Transactions on Dielectrics and Electrical Insulation 2026 DOI: 10.1109/TDEI.2025.3610405
  +Save
• Revealing the Reliability Performance of a Dielectric-Modulated Negative Capacitance Junctionless FinFET Biosensor
  IEEE Transactions on Dielectrics and Electrical Insulation 2025 DOI: 10.1109/TDEI.2024.3504407
  +Save
• Unveiling the reliability of negative capacitance FinFET with confrontation of different HfO2-ferroelectric dopants
  Solid-State Electronics 2024 DOI: 10.1016/j.sse.2024.108896
  +Save
• A proof of concept for reliability aware analysis of junctionless negative capacitance FinFET-based hydrogen sensor
  Smart Materials and Structures 2024 DOI: 10.1088/1361-665X/ad2028
  +Save
• Demonstration of a Nanosheet FET With High Thermal Conductivity Material as Buried Oxide: Mitigation of Self-Heating Effect
  IEEE Transactions on Electron Devices 2023 DOI: 10.1109/TED.2023.3241884
  +Save
• Trap and self-heating effect based reliability analysis to reveal early aging effect in nanosheet FET
  Solid-State Electronics 2023 DOI: 10.1016/j.sse.2022.108546
  +Save
• Self-Heating Aware Threshold Voltage Modulation Conforming to Process and Ambient Temperature Variation for Reliable Nanosheet FET
  2023 IEEE International Reliability Physics Symposium (IRPS) 2023 DOI: 10.1109/irps48203.2023.10117918
  +Save
• Self-Heating and Interface Traps Assisted Early Aging Revelation and Reliability Analysis of Negative Capacitance FinFET
  2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) 2023 DOI: 10.1109/edtm55494.2023.10103127
  +Save
• Demonstration of a Junctionless Negative Capacitance FinFET-based Hydrogen Gas Sensor: A Reliability Perspective
  2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) 2023 DOI: 10.1109/edtm55494.2023.10103028
  +Save
• Analytical Model of Dual Cavity Nanowire Tunnel FET-based Dielectric Modulated Biosensor
  2023 IEEE Devices for Integrated Circuit (DevIC) 2023 DOI: 10.1109/devic57758.2023.10134885
  +Save