PAVAN KUMAR JAVVAJI

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Publications (2)

• Test Pattern Generation and Critical Path Selection in the Presence of Statistical Delays
  IEEE Transactions on Very Large Scale Integration (VLSI) Systems 2020 DOI: 10.1109/TVLSI.2019.2941426
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• On the Sensitization Probability of a Critical Path Considering Process Variations and Path Correlations
  IEEE Transactions on Very Large Scale Integration (VLSI) Systems 2019 DOI: 10.1109/TVLSI.2019.2893844
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