AASIF MOHAMMAD BHAT

Employment

• Cardiff University POST DOCTORAL RESEARCH ASSOCIATE
  2024 - Present

Education

Education history is unavailable.

Projects & Funding

Projects & funding information is unavailable.

Publications (32)

• Enhancing Breakdown and Microwave Performance of AlGaN/GaN HEMTs Through Tailored Passivation Layers: Design, Optimization, and Performance Analysis
  Transactions on Electrical and Electronic Materials 2025 DOI: 10.1007/s42341-025-00603-1
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• Impact of geometrical parameters on AlGaN/GaN heterostructure MOS-HEMT biosensor
  Journal of Computational Electronics 2025 DOI: 10.1007/s10825-024-02247-5
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• Dual-Gate RF HEMT Based on P-GaN/AlGaN on Si Technology for Future X-Band On-Chip RF and Power Electronics
  Cs Mantech 2025 2025 International Conference on Compound Semiconductor Manufacturing Technology 2025
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• A theoretical approach to study the frequency dependent dielectric behavior of breast cancer cells using AlN buffer-based AlGaN/GaN HEMT
  Physica Scripta 2024 DOI: 10.1088/1402-4896/ad4520
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• A comprehensive simulation study on dual segment AlGaN/GaN HEMT for mercury ion detection: Addressing steric hindrance and interfering ions
  Materials Science and Engineering B 2024 DOI: 10.1016/j.mseb.2024.117204
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• Performance Assessment of AlGaN/GaN HEMT for Human Serum Albumin Detection Using Charge Deduction Methodology
  IEEE Sensors Journal 2024 DOI: 10.1109/JSEN.2024.3385496
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• Recessed Trench Gate AlGaN/GaN HEMT for pH Monitoring: Design and Sensitivity Evaluation
  IEEE Transactions on Nanotechnology 2024 DOI: 10.1109/TNANO.2024.3422181
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• AlGaN/GaN high electron mobility transistor for various sensing applications: A review
  Micro and Nanostructures 2023 DOI: 10.1016/j.micrna.2023.207528
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• Performance Analysis of AlGaN MOSHEMT Based Biosensors for Detection of Proteins
  Transactions on Electrical and Electronic Materials 2023 DOI: 10.1007/s42341-023-00434-y
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• Improved breakdown voltage mechanism in AlGaN/GaN HEMT for RF/Microwave applications: Design and physical insights of dual field plate
  Microelectronics Reliability 2023 DOI: 10.1016/j.microrel.2023.115036
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