Jaewook Yoo

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Publications (4)

• Discovery of Energy‐Localized Trap States via Opto‐Electrical Spectroscopy in UWBG Perovskite La:SrSnO3 FETs
  Advanced Functional Materials 2026 DOI: 10.1002/adfm.77854
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• Localized electrothermal annealing for rapid recovery of ambient degradation in indium oxide transistors via COMSOL simulations and experimental characterization
  Applied Physics Letters 2026 DOI: 10.1063/5.0324275
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• Determination of donor- and acceptor-like interface trap density using photoresponsive GIDL in vertically stacked Si-NW GAA FETs
  Applied Physics Letters 2025 DOI: 10.1063/5.0254522
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• Low-frequency noise and DC I–V characterization of gamma-ray irradiation-induced degradation and trap behaviors in a-IGZO TFTs
  Applied Physics Letters 2025 DOI: 10.1063/5.0238211
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