0009-0003-1730-9426 Employment
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Publications (12)
- Reliability-Oriented Design of Source-All-Around Vertical TFETs: Mitigation Strategies for Noise, Interface Traps, and Thermal Instability Save
- Detailed Investigation of Double-Source Vertical Tunnel Field-Effect Transistor (DS-VTFET) Behavior Under DC and AC Operating Conditions Save
- Analytical modeling of III-V heterojunction source-all-around vertical tunnel FET and its inverter circuit application Save
- Cutting-edge vertical tunnel FETs: GaSb/InSb heterojunction source-all-around tunnel FET with I60 of 2.73×10⁻⁴ A/μm and Sub-10 mV/dec SS Save
- Noise behavior in GaAs0.2Sb0.8/GaSb heterojunction Source-All-Around vertical Tunnel FET: A comprehensive study Save
- Design, optimization, and performance analysis of GaP/Si heterojunction Fin-TFET with MoS2 nanoribbon channel Save
- Dielectric modulation-based biomolecule detection using III-V vertical source-all-around tunnel FET Save
- Unveiling the influence of temperature and interface traps on the performance of source-all-around vertical TFET Save
- Achievement of extremely small subthreshold swing in Vertical Source-All-Around-TFET with suppressed ambipolar conduction Save
- Evolution of Tunnel Field-Effect Transistor and Scope in Low Power Applications: A Detailed Review Save