Deven H. Patil

Employment

• Indian Institute of Technology Bhubaneswar JRF

Education

Education history is unavailable.

Projects & Funding

Projects & funding information is unavailable.

Publications (10)

• A Novel De-Mirroring-Based Analytical Model for Capacitance Extraction of Nanosheet FET Using Dielectric Permittivity Suppression
  IEEE Transactions on Dielectrics and Electrical Insulation 2026 DOI: 10.1109/TDEI.2025.3619803
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• On the Reliability of Complementary Field Effect Transistor: Unveiling the Role of Grain Granularities and Random Fluctuations
  IEEE Transactions on Device and Materials Reliability 2026 DOI: 10.1109/TDMR.2026.3665263
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• Demonstrating the Electro-Thermal Dynamics in Complementary FETs: Quantifying the Role of Self-Heating and Grain Effect Intercoupling
  IEEE Transactions on Electron Devices 2026 DOI: 10.1109/TED.2026.3664068
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• Electro-thermal Reliability Assessment of an Asymmetric Spacer Complementary FET: Device to Circuit Co-optimization
  IEEE Transactions on Device and Materials Reliability 2026 DOI: 10.1109/TDMR.2026.3716119
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• Assessing the impact of process and design variations on reliability of complementary FET
  Solid-State Electronics 2025 DOI: 10.1016/j.sse.2025.109226
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• A Novel De-Mirroring Approach for Capacitance and Resistance Extraction in Complementary FET: A Quasi-Static Small Signal Model
  2025 Device Research Conference (DRC) 2025 DOI: 10.1109/drc66027.2025.11105724
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• A Novel De-Mirroring Approach for Bias-Dependent Capacitance Extraction in Nanosheet Fet Using Conformal Mapping
  2025 9th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) 2025 DOI: 10.1109/edtm61175.2025.11040749
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• Self-Heating and Process Induced Performance Barrier on Complementary Field Effect Transistor: A Reliability Perspective
  2025 9th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) 2025 DOI: 10.1109/edtm61175.2025.11041030
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• Demonstrating Novel Interbridge Complementary FET: Capacitance Extraction using Dielectric Permittivity Suppression and Conformal Mapping
  IEEE Transactions on Dielectrics and Electrical Insulation 2025 DOI: 10.1109/TDEI.2025.3645707
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• Self-Heating Induced Differential Resistance in Complementary FET: The Role of Dielectric Insulation in Thermal Dynamics
  IEEE Transactions on Dielectrics and Electrical Insulation 2025 DOI: 10.1109/TDEI.2025.3638731
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