Abhay pratap Singh

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Publications (11)

• A wide temperature benchmark of the Re-G-HCJNFe FET for noise reduction in low-power analog integration
  Micro and Nanostructures 2026 DOI: 10.1016/j.micrna.2026.208565
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• Sensitivity Detection of CH2Cl2 at 0–50 ppm with CJN-FETs: High Analog/RF/Linearity Performance at Room Temperature
  ECS Journal of Solid State Science and Technology 2026 DOI: 10.1149/2162-8777/ae3256
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• Advanced CJ-NFe-FET architectures with ferroelectric gate stacks: Optimizing Electrostatics, linearity, and energy storage for next-generation nanoelectronics
  Micro and Nanostructures 2025 DOI: 10.1016/j.micrna.2025.208386
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• A Novel Low-Power N-bit Comparator Design with Optimized Transistor Count for Energy-Efficient VLSI Applications
  Circuits, Systems, and Signal Processing 2025 DOI: 10.1007/s00034-025-03194-7
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• Optimizing reliability and performance in Re-G-CJNFe-FETs: The role of gate work function and high-k dielectrics in analog and linearity innovations
  Micro and Nanostructures 2025 DOI: 10.1016/j.micrna.2025.208187
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• Graphene Nanoribbon-FET for Higher Drive Current using Machine Learning-Enhanced First Principles Analysis
  Electrical Engineering and Technology 2025 DOI: 10.54963/eet.v1i1.1283
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• Enhancing VLSI Design Efficiency With ML‐Based C‐ANN: Performance Optimization of Gate‐Stacked Ferroelectric FE‐MOSFETs for High‐Speed and RF Applications
  International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 2025 DOI: 10.1002/jnm.70064
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• Next-generation ferroelectric FETs: Modeling of recessed gate cylindrical junction less nanowire FETs for optimal electrostatic and linearity characteristics
  Micro and Nanostructures 2025 DOI: 10.1016/j.micrna.2025.208095
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• Ferroelectric Based Low Power MOSFET for DC/RF Applications: Machine Learning Assisted Statistical Variation Analysis
  ECS Journal of Solid State Science and Technology 2024 DOI: 10.1149/2162-8777/ad3e2e
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• Integration of Machine Learning with Statistical Variation Analysis for Ferroelectric Transistor (FE-MOSFETs)
  Materials Open 2024 DOI: 10.1142/S2811086224400016
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