CM
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Publications (302)
- Deformation-induced stress/strain mapping and performance evaluation of a-IGZO thin-film transistors for flexible electronic applications Save
- Design study of gate-all-around vertically stacked nanosheet FETs for sub-7nm nodes Save
- Investigation of work function variation on the electrical performance of sub-7nm GAA FETs Save
- Strained SiGe channel TFTs for flexible electronics applications Save
- Stress-engineered AlGaN/GaN high electron mobility transistors design Save
- Toward Ultimate Scaling: From FinFETs to Nanosheet Transistors Save
- Atomistic Level Process to Device Simulation of GaNFET Using TNL TCAD Tools Save
- Design and simulation of vertically-stacked nanowire transistors at 3nm technology nodes Save
- Low Frequency Noise Analysis in Strained-Si Devices Save
- Modeling and Performance Analysis of n-FinFETs: A Comparative Study Save
- NBTI studies in GaAs p-MOSFETs Save
- Performance Analysis of FinFETs with Strained-Si Fin on Strain-Relaxed Buffer Save
- Performance Analysis of Si-Channel Nanosheet FETs with Strained SiGe Source/Drain Stressors Save
- Performance Analysis of Sub-10nm Vertically Stacked Gate-All-Around FETs Save
- Random discrete dopant induced variability in gate-all-around si-nanowire FETs Save
- Role of stress/strain mapping and random dopant fluctuation in advanced CMOS process technology nodes Save
- Source/drain stressor design for advanced devices at 7 nm technology node Save
- Strain engineering in AlGaN/GaN HEMTs for performance enhancement Save
- Strain induced variability study in Gate-All-Around vertically-stacked horizontal nanosheet transistors Save
- Strain-engineering in nanowire field-effect transistors at 3 nm technology node Save