Employment
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Delhi Technological University
Education
Education history is unavailable.
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Publications (3)
- Investigating DFT and Device-Level Behavior in Doped Ferroelectric HfO2-Based HD-VS-FeFinFET With Self-Heating and Logic Circuit Perspectives Save
- Reliability analysis of the intricacies of interfacial trap charges in HD-VS-FeFinFET and its applicability as CMOS inverter Save
- Unveiling the Impact of Interfacial Trap Charges on Strained VS-FeFinFETs for Improved Reliability:Device to Circuit Level Assessment Save